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You searched for: mediatype:texts AND collection:NISTTechNotes AND subject:"Probes (Electronic Instruments)"
[texts]Characterization of a high frequency probe assembly for integrated circuit measurements (Volume NBS Technical Note 663) - Jesch, Ramon L.; Hoer, C. A.

Keywords: Integrated circuits--Measurement; Probes (Electronic instruments)
Downloads: 65
[texts]X-Ray wavelength conversion tables and graphs for qualitative electron probe microanalysis. (Volume NBS Technical Note 406) - Heinrich, Kurt F. J.; Giles, Mary Ann M.
Tables and graphs have been constructed for electron probe x-ray spectrometers equipped with crystal changers a * nd calibrated for LiF crystals in angstroms.These tables indicate the equivalent reading for the lines which can be normally expected to appe
Keywords: Spectrum analysis--Tables; X-rays; Probes (Electronic instruments)
Downloads: 61
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